Characterization of materials composition at the nanometer scale by Secondary Ion Mass Spectrometry (SIMS) microscopy
Mercredi 6 avril 2011
à 11h en salle C. Brot
SIMS microscopy is a technique extensively used in a broad range of application to determine the chemical composition of materials. In this technique, projectiles (atomic or cluster ions) in a 10-100 keV range of energy are fired at the sample to be analyzed. The resulting interaction between the projectile and target induces the sputtering of secondary ions from the material. Those ions are mass analyzed via mass spectrometry such providing chemical informations on the material composition.
One of the gold standard instrument in the field of SIMS microscopy is the Nanosims50 which allows mapping of up to 7 elements, with an ultimate spatial lateral resolution of 35 nm. Examples of application with this instrument will be addressed for the fields of biology, cosmochemistry and optical fibers along with a technical description.
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