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Accueil du site > Recherche > Plateformes technologiques > Centre de micro & nanorhéométrie > Appareillages > Caractérisation de micro et nanoparticules > AFM Agilent 5500

AFM Agilent 5500

This atomic force microscope allows the high-resolution surface images (see instructions), as well as force measurements in air or in a liquid medium. In this model the measurement head and the sample translation piezo is over sample which facilitates an adaptation to different environments and samples

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AFM Agilent 5100
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technical specifications AFM Agilent 5500